{"product_id":"two-dimensional-x-ray-diffraction-isbn-9781119356103","title":"Two-dimensional X-ray Diffraction","description":"\u003cp\u003e\u003cb\u003eAn indispensable resource for researchers and students in materials science, chemistry, physics, and pharmaceuticals\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eWritten by one of the pioneers of 2D X-Ray Diffraction, this updated and expanded edition of the definitive text in the field provides comprehensive coverage of the fundamentals of that analytical method, as well as state-of-the art experimental methods and applications. Geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening are all covered in detail. Numerous experimental examples in materials research, manufacture, and pharmaceuticals are provided throughout.\u003c\/p\u003e \u003cp\u003eTwo-dimensional x-ray diffraction is the ideal, non-destructive analytical method for examining samples of all kinds including metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials, composites, and more. \u003ci\u003eTwo-Dimensional X-Ray Diffraction, Second Edition \u003c\/i\u003eis an up-to-date resource for understanding how the latest 2D detectors are integrated into diffractometers, how to get the best data using the 2D detector for diffraction, and how to interpret this data. All those desirous of setting up a 2D diffraction in their own laboratories will find the author’s coverage of the physical principles, projection geometry, and mathematical derivations extremely helpful.\u003c\/p\u003e \u003cul\u003e \u003cli\u003eFeatures new contents in all chapters with most figures in full color to reveal more details in illustrations and diffraction patterns\u003c\/li\u003e \u003cli\u003eCovers the recent advances in detector technology and 2D data collection strategies that have led to dramatic increases in the use of two-dimensional detectors for x-ray diffraction\u003c\/li\u003e \u003cli\u003eProvides in-depth coverage of new innovations in x-ray sources, optics, system configurations, applications and data evaluation algorithms\u003c\/li\u003e \u003cli\u003eContains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis \u003c\/li\u003e \u003c\/ul\u003e \u003cp\u003e\u003ci\u003eTwo-Dimensional X-Ray Diffraction, Second Edition\u003c\/i\u003e is an important working resource for industrial and academic researchers and developers in materials science, chemistry, physics, pharmaceuticals, and all those who use x-ray diffraction as a characterization method. Users of all levels, instrument technicians and X-ray laboratory managers, as well as instrument developers, will want to have it on hand.\u003c\/p\u003eDie zweidimensionale Röntgendiffraktion ist die ideale, zerstörungsfreie Analysemethode für Proben aller Art. Hierzu gehören Metalle, Polymere, Keramiken, Halbleiter, Dünnfilme, Beschichtungen, Farben, Biomaterialien, Verbundstoffe u.v.m. Die 2. Auflage von Two-Dimensional X-Ray Diffraction erläutert als aktuelles Referenzwerk, wie die neuesten 2D-Dektektoren in Diffraktometer integriert werden, wie sich mithilfe eines 2D-Detektors für Diffraktometer die besten Daten gewinnen lassen und wie die Daten zu interpretieren sind. Überaus hilfreich für alle, die die 2D-Diffraktion im eigenen Labor umsetzen möchten, sind die Ausführungen des Autors zu den physikalischen Prinzipien, zur Projektionsgeometrie und zu mathematischen Ableitungen.\u003cbr\u003e - Bietet neue Inhalte in allen Kapiteln. Die meisten Abbildungen sind gänzlich in Farbe und zeigen so mehr Einzelheiten in den Illustrationen und Diffraktionsmustern.\u003cbr\u003e - Deckt die jüngsten Fortschritte in der Detektortechnik und bei Strategien zur zweidimensionalen Datensammlung ab, die dazu geführt haben, dass 2D-Detektoren verstärkt in der Röntgendiffraktion zum Einsatz kommen.\u003cbr\u003e - Behandelt ausführlich neue Innovationen im Hinblick auf Röntgenquellen, Optik, Systemkonfigurationen, Anwendungen und Algorithmen zur Datenevaluierung.\u003cbr\u003e - Enthält neue Methoden und Beispiele für Versuchsaufbauten für Belastungs-, Textur-, Kristallgröße-, Kristallorientierungs- und Dünnfilmanalysen.\u003cbr\u003e \u003cbr\u003e Die 2. Auflage von Two-Dimensional X-Ray Diffraction ist ein wichtiges Referenzwerk für Forscher und Entwickler in den Materialwissenschaften, der Chemie und Physik sowie im Pharmabereich, sowohl in der Industrie als auch im universitären Umfeld, und für alle, die die Röntgendiffraktion als Charakterisierungsverfahren einsetzen. Dieses Nachschlagewerk darf in der Handbibliothek von Anwendern auf allen Ebenen, von Gerätetechnikern, Managern in Röntgenlabors und Geräteentwicklern nicht fehlen.\u003cbr\u003e \u003cp\u003ePreface xiii\u003c\/p\u003e \u003cp\u003e\u003cb\u003e1. Introduction 1\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e1.1 X-Ray Technology, a Brief History, 1\u003c\/p\u003e \u003cp\u003e1.2 Geometry of Crystals, 2\u003c\/p\u003e \u003cp\u003e1.3 Principles of X-Ray Diffraction, 11\u003c\/p\u003e \u003cp\u003e1.4 Reciprocal Space and Diffraction, 13\u003c\/p\u003e \u003cp\u003e1.5 Two-Dimensional X-Ray Diffraction, 19\u003c\/p\u003e \u003cp\u003eReferences, 26\u003c\/p\u003e \u003cp\u003e\u003cb\u003e2. Geometry and Fundamentals 29\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e2.1 Introduction, 29\u003c\/p\u003e \u003cp\u003e2.2 Diffraction Space and Laboratory Coordinates, 31\u003c\/p\u003e \u003cp\u003e2.3 Detector Space and Detector Geometry, 35\u003c\/p\u003e \u003cp\u003e2.4 Sample Space and Goniometer Geometry, 46\u003c\/p\u003e \u003cp\u003e2.5 Transformation from Diffraction Space to Sample Space, 50\u003c\/p\u003e \u003cp\u003e2.6 Reciprocal Space, 52\u003c\/p\u003e \u003cp\u003e2.7 Summary, 53\u003c\/p\u003e \u003cp\u003eReferences, 55\u003c\/p\u003e \u003cp\u003e\u003cb\u003e3. X-Ray Source and Optics 57\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e3.2 X-Ray Optics, 63\u003c\/p\u003e \u003cp\u003eReferences, 85\u003c\/p\u003e \u003cp\u003e\u003cb\u003e4. X-Ray Detectors 87\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e4.1 History of X-Ray Detection Technology, 87\u003c\/p\u003e \u003cp\u003e4.2 Point Detectors in Conventional Diffractometers, 89\u003c\/p\u003e \u003cp\u003e4.3 Characteristics of Point Detectors, 92\u003c\/p\u003e \u003cp\u003e4.4 Line Detectors, 100\u003c\/p\u003e \u003cp\u003e4.5 Characteristics of Area Detectors, 107\u003c\/p\u003e \u003cp\u003e4.6 Types of Area Detectors, 119\u003c\/p\u003e \u003cp\u003eReferences, 137\u003c\/p\u003e \u003cp\u003e\u003cb\u003e5. Goniometer and Sample Stages 141\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e5.1 Goniometer and Sample Position, 141\u003c\/p\u003e \u003cp\u003e5.2 Goniometer Accuracy, 145\u003c\/p\u003e \u003cp\u003e5.3 Sample Alignment and Visualization Systems, 149\u003c\/p\u003e \u003cp\u003e5.4 Environment Stages, 151\u003c\/p\u003e \u003cp\u003eReferences, 155\u003c\/p\u003e \u003cp\u003e\u003cb\u003e6. Data Treatment 157\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e6.1 Introduction, 157\u003c\/p\u003e \u003cp\u003e6.2 Non-Uniform Response Correction, 157\u003c\/p\u003e \u003cp\u003e6.3 Spatial Correction, 161\u003c\/p\u003e \u003cp\u003e6.4 Detector Position Accuracy and Calibration, 166\u003c\/p\u003e \u003cp\u003e6.5 Frame Integration, 177\u003c\/p\u003e \u003cp\u003e6.6 Multiple Frame Merge, 186\u003c\/p\u003e \u003cp\u003e6.7 Scanning 2D Pattern, 194\u003c\/p\u003e \u003cp\u003e6.8 Lorentz, Polarization, and Absorption Corrections, 197\u003c\/p\u003e \u003cp\u003eReferences, 208\u003c\/p\u003e \u003cp\u003e\u003cb\u003e7. Phase Identification 211\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e7.1 Introduction, 211\u003c\/p\u003e \u003cp\u003e7.2 Relative Intensity, 212\u003c\/p\u003e \u003cp\u003e7.3 Geometry and Resolution, 216\u003c\/p\u003e \u003cp\u003e7.4 Sampling Statistics, 221\u003c\/p\u003e \u003cp\u003e7.5 Preferred Orientation Effect, 227\u003c\/p\u003e \u003cp\u003eReferences, 233\u003c\/p\u003e \u003cp\u003e\u003cb\u003e8. Texture Analysis 235\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e8.1 Introduction, 235\u003c\/p\u003e \u003cp\u003e8.2 Pole Density and Pole-Figure, 236\u003c\/p\u003e \u003cp\u003e8.3 Fundamental Equations, 238\u003c\/p\u003e \u003cp\u003e8.4 Data Collection Strategy, 242\u003c\/p\u003e \u003cp\u003e8.5 Texture Data Process, 251\u003c\/p\u003e \u003cp\u003e8.6 Orientation Distribution Function, 256\u003c\/p\u003e \u003cp\u003e8.7 Fiber Texture, 261\u003c\/p\u003e \u003cp\u003e8.8 Polymer Texture, 264\u003c\/p\u003e \u003cp\u003e8.9 Other Advantages of XRD2 for Texture, 268\u003c\/p\u003e \u003cp\u003eReferences, 269\u003c\/p\u003e \u003cp\u003e\u003cb\u003e9. Stress Measurement 271\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e9.1 Introduction, 271\u003c\/p\u003e \u003cp\u003e9.2 Principle of X-ray Stress Analysis, 280\u003c\/p\u003e \u003cp\u003e9.3 Theory of Stress Analysis with XRD2, 292\u003c\/p\u003e \u003cp\u003e9.4 Process of Stress Measurement with XRD2, 307\u003c\/p\u003e \u003cp\u003e9.5 Experimental Examples, 325\u003c\/p\u003e \u003cp\u003eA9.1 Calculate Principal Stresses, 349\u003c\/p\u003e \u003cp\u003eA9.2 Calculate the direction cosines for principal stresses (Eigenvectors), 350\u003c\/p\u003e \u003cp\u003eReferences, 353\u003c\/p\u003e \u003cp\u003e\u003cb\u003e10. Small Angle X-ray Scattering 357\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e10.1 Introduction, 357\u003c\/p\u003e \u003cp\u003e10.2 2D SAXS Systems, 361\u003c\/p\u003e \u003cp\u003e10.3 Applications Examples, 367\u003c\/p\u003e \u003cp\u003e10.4 Some Innovations in 2D SAXS, 370\u003c\/p\u003e \u003cp\u003eReferences, 374\u003c\/p\u003e \u003cp\u003e\u003cb\u003e11. Combinatorial Screening 379\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e11.1 Introduction, 379\u003c\/p\u003e \u003cp\u003e11.2 XRD2 Systems for High Throughput Screening, 380\u003c\/p\u003e \u003cp\u003e11.3 Combined Screening with XRD2 and Raman, 390\u003c\/p\u003e \u003cp\u003eReference, 393\u003c\/p\u003e \u003cp\u003e\u003cb\u003e12. Miscellaneous Applications 395\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e12.1 Percent Crystallinity, 395\u003c\/p\u003e \u003cp\u003e12.2 Crystal Size, 402\u003c\/p\u003e \u003cp\u003e12.3 Retained Austenite, 412\u003c\/p\u003e \u003cp\u003e12.4 Crystal Orientation, 414\u003c\/p\u003e \u003cp\u003e12.5 Thin Film Analysis, 418\u003c\/p\u003e \u003cp\u003eReference, 429\u003c\/p\u003e \u003cp\u003e\u003cb\u003e13. Innovation and Future Development 433\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e13.1 Introduction, 433\u003c\/p\u003e \u003cp\u003e13.2 Scanning Line Detector for XRD2, 434\u003c\/p\u003e \u003cp\u003e13.3 Three-Dimensional Detector, 438\u003c\/p\u003e \u003cp\u003e13.4 Pixel Direct Diffraction Analysis, 441\u003c\/p\u003e \u003cp\u003e13.5 High Resolution Two-Dimensional X-Ray Diffractometer, 444\u003c\/p\u003e \u003cp\u003eReferences, 451\u003c\/p\u003e \u003cp\u003eAppendix A. Values of Commonly Used Parameters 453\u003c\/p\u003e \u003cp\u003eAppendix B. Symbols 459\u003c\/p\u003e \u003cp\u003eIndex 465\u003c\/p\u003e \u003cp\u003e\u003cb\u003eBob B. He, PhD,\u003c\/b\u003e is Director of Innovation and Business Development XRD2 at Bruker AXS-an industry leader in X-ray diffraction instrumentation and solutions (formally Siemens AXS). Dr. He holds 17 U.S. patents and two R\u0026amp;D 100 awards in XRD instrumentation. In recognition of his contribution to the XRD community, he has been recently awarded ICDD Fellow. He earned his doctorate in materials science from Virginia Tech.\u003c\/p\u003e  \u003cp\u003e\u003cb\u003eAn Indispensable Resource for Researchers and Students in Materials Science, Chemistry, Physics, and Pharmaceuticals\u003c\/b\u003e \u003c\/p\u003e\u003cp\u003eWritten by one of the pioneers of 2D X-Ray Diffraction, this updated and expanded edition of the definitive text in the field provides comprehensive coverage of the fundamentals of that analytical method, as well as state-of-the art experimental methods and applications. Geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening are all covered in detail. Numerous experimental examples in materials research, manufacture, and pharmaceuticals are provided throughout. \u003c\/p\u003e\u003cp\u003eTwo-dimensional x-ray diffraction is the ideal, non-destructive analytical method for examining samples of all kinds including metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials, composites, and more. \u003ci\u003eTwo-Dimensional X-Ray Diffraction, Second Edition\u003c\/i\u003e is an up-to-date resource for understanding how the latest 2D detectors are integrated into diffractometers, how to get the best data using the 2D detector for diffraction, and how to interpret this data. All those desirous of setting up a 2D diffraction in their own laboratories will find the author's coverage of the physical principles, projection geometry, and mathematical derivations extremely helpful. \u003c\/p\u003e\u003cul\u003e \u003cli\u003eFeatures new contents in all chapters with most figures in full color to reveal more details in illustrations and diffraction patterns\u003c\/li\u003e \u003cli\u003eCovers the recent advances in detector technology and 2D data collection strategies that have led to dramatic increases in the use of two-dimensional detectors for x-ray diffraction\u003c\/li\u003e \u003cli\u003eProvides in-depth coverage of new innovations in x-ray sources, optics, system configurations, applications and data evaluation algorithms\u003c\/li\u003e \u003cli\u003eContains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis\u003c\/li\u003e \u003c\/ul\u003e \u003cp\u003e\u003ci\u003eTwo-Dimensional X-Ray Diffraction, Second Edition\u003c\/i\u003e is an important working resource for industrial and academic researchers and developers in materials science, chemistry, physics, pharmaceuticals, and all those who use x-ray diffraction as a characterization method. Users of all levels, instrument technicians and X-ray laboratory managers, as well as instrument developers, will want to have it on hand.\u003c\/p\u003e","brand":"Wiley","offers":[{"title":"Default Title","offer_id":47990421061861,"sku":"NP9781119356103","price":180.95,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/1842\/7735\/files\/9781119356103.jpg?v=1761787759","url":"https:\/\/k12savings.com\/products\/two-dimensional-x-ray-diffraction-isbn-9781119356103","provider":"K12savings","version":"1.0","type":"link"}