{"product_id":"optic-technologies-enabling-fusion-ignition-isbn-9781394268245","title":"Optic Technologies Enabling Fusion Ignition","description":"\u003cp\u003e\u003cb\u003eA powerful and up-to-date desk reference for advancements in optic technologies for high energy lasers\u003c\/b\u003e \u003c\/p\u003e\u003cp\u003eIn \u003ci\u003eOptic Technologies Enabling Fusion Ignition,\u003c\/i\u003e a team of veteran optics and laser specialists deliver an expert summary of optic manufacturing technologies, laser-induced optic damage reduction technologies, and optic repair \u0026amp; recycle technologies. The authors explore the fundamental scientific phenomena and how they have driven the development of optic technologies as well as the process of transitioning from scientific discovery to large-scale production. \u003c\/p\u003e\u003cp\u003eThe book combines examinations of improving overall optic performance, optic survivability, and laser performance. It also covers novel bulk material developments, yield processing improvement methods, novel metrologies, and advancements in increasing laser-induced damage resistance. \u003c\/p\u003e\u003cp\u003eReaders will also find: \u003c\/p\u003e\u003cul\u003e\n\u003cli\u003eA thorough introduction to the details of optics recycle loop technologies, including the refurbishment and repair of laser-induced damaged optics\u003c\/li\u003e\n\u003cli\u003eComprehensive explorations of advancements in optical fabrication and post-processing reducing laser damaging surface precursors\u003c\/li\u003e\n\u003cli\u003ePractical discussions of the fundamental physics of laser-matter interactions related to laser-induced damage\u003c\/li\u003e\n\u003cli\u003eComplete treatments of laser-induced damage data management, the use of online shadow blockers, and novel optics metrologies\u003c\/li\u003e\n\u003c\/ul\u003e \u003cp\u003eIdeal for optical and laser scientists, engineers, and fabricators of optical materials and components, \u003ci\u003eOptic Technologies Enabling Fusion Ignition\u003c\/i\u003e is also a valuable resource for graduate students interested in optics, as well as high-energy and high-power laser research. \u003c\/p\u003e\u003cp\u003eList of Figures xv\u003c\/p\u003e \u003cp\u003eList of Contributors liii\u003c\/p\u003e \u003cp\u003ePreface lv\u003c\/p\u003e \u003cp\u003eAcknowledgments lix\u003c\/p\u003e \u003cp\u003eGlossary of Symbols and Abbreviations lxi\u003c\/p\u003e \u003cp\u003e\u003cb\u003e1 Introduction – Path to Ignition Enabled by Optics 1\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eTayyab I. Suratwala\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e1.1 Ignition 1\u003c\/p\u003e \u003cp\u003e1.2 National Ignition Facility 5\u003c\/p\u003e \u003cp\u003e1.3 NIF Large Optics 7\u003c\/p\u003e \u003cp\u003e1.3.1 Optic Technologies Development 8\u003c\/p\u003e \u003cp\u003e1.3.2 Laser Damage Reduction 13\u003c\/p\u003e \u003cp\u003e1.3.3 Optics Recycle Loop Strategy 15\u003c\/p\u003e \u003cp\u003e1.3.4 Loop Management and Performance 18\u003c\/p\u003e \u003cp\u003e1.3.5 Ingredients for Success 20\u003c\/p\u003e \u003cp\u003e1.4 Book Organization 22\u003c\/p\u003e \u003cp\u003eReferences 24\u003c\/p\u003e \u003cp\u003e\u003cb\u003ePart I Optic Manufacturing Technologies 29\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e\u003cb\u003e2 NIF Optics 31\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eChristopher J. Stolz, Kathleen I. Schaffers, Lana L. Wong, and Hoang T. Nguyen\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e2.1 NIF Optics Functionality 31\u003c\/p\u003e \u003cp\u003e2.2 Front-End and Diagnostic Optics 35\u003c\/p\u003e \u003cp\u003e2.3 Amplifier Optics 37\u003c\/p\u003e \u003cp\u003e2.3.1 Laser Glass 37\u003c\/p\u003e \u003cp\u003e2.3.2 Cladding 39\u003c\/p\u003e \u003cp\u003e2.3.3 Blast Shields 39\u003c\/p\u003e \u003cp\u003e2.4 Vacuum Barriers and Focusing Optics 40\u003c\/p\u003e \u003cp\u003e2.4.1 Spatial Filter Lenses (SF1-4) 40\u003c\/p\u003e \u003cp\u003e2.4.2 Vacuum Windows (SW, TCVW, and GDS) 42\u003c\/p\u003e \u003cp\u003e2.4.3 Off-Axis Wedged Focus Lens (WFL) 43\u003c\/p\u003e \u003cp\u003e2.5 Beam-Steering Optics 44\u003c\/p\u003e \u003cp\u003e2.5.1 Cavity Mirrors (LM1-2) 45\u003c\/p\u003e \u003cp\u003e2.5.2 Transport Mirrors (LM4-8) 46\u003c\/p\u003e \u003cp\u003e2.6 Polarizing Optics and Frequency Conversion 49\u003c\/p\u003e \u003cp\u003e2.6.1 Polarizing Optics (PL, SC, and PR) 49\u003c\/p\u003e \u003cp\u003e2.6.2 Frequency Conversion Crystals (SHG and THG) 51\u003c\/p\u003e \u003cp\u003e2.7 Beam-Formatting Optics (Continuous Phase Plates) 52\u003c\/p\u003e \u003cp\u003e2.8 Debris-Shield Optics 54\u003c\/p\u003e \u003cp\u003e2.8.1 Disposable Debris Shield (DDS) 54\u003c\/p\u003e \u003cp\u003e2.8.2 Fused-Silica Debris Shield (FSDS) 55\u003c\/p\u003e \u003cp\u003e2.8.3 Grating Debris Shield (GDS) 56\u003c\/p\u003e \u003cp\u003e2.9 Short Pulse Optics for Advanced Radiographic Capability (ARC) 58\u003c\/p\u003e \u003cp\u003e2.10 Summary 65\u003c\/p\u003e \u003cp\u003eReferences 65\u003c\/p\u003e \u003cp\u003e\u003cb\u003e3 Optics Industry, Facilitization, and Sustainability 73\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eChristopherJ.Stolz\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e3.1 Vendor Partnership Strategy 73\u003c\/p\u003e \u003cp\u003e3.1.1 Technology Development 74\u003c\/p\u003e \u003cp\u003e3.1.2 Facilitization 75\u003c\/p\u003e \u003cp\u003e3.1.3 Pilot Production 79\u003c\/p\u003e \u003cp\u003e3.1.4 Production 80\u003c\/p\u003e \u003cp\u003e3.2 Manufacturing Rate Improvement 82\u003c\/p\u003e \u003cp\u003e3.2.1 Continuous Melting of Laser Phosphate Glass 82\u003c\/p\u003e \u003cp\u003e3.2.2 Fabrication of Crystal Optics 82\u003c\/p\u003e \u003cp\u003e3.2.3 Grinding Technology of Glass Optics (ELID) 85\u003c\/p\u003e \u003cp\u003e3.2.4 Computer Controlled Polishing of Fused-Silica Optics 86\u003c\/p\u003e \u003cp\u003e3.3 Strategies for Robust Optics Supply 88\u003c\/p\u003e \u003cp\u003e3.3.1 Competitive Versus Sole Source 88\u003c\/p\u003e \u003cp\u003e3.3.2 Minimizing Optics Supply Risk 90\u003c\/p\u003e \u003cp\u003e3.4 Institutional Partnerships 92\u003c\/p\u003e \u003cp\u003e3.5 Sustainability for Multi-decade Operations 93\u003c\/p\u003e \u003cp\u003e3.6 Summary 94\u003c\/p\u003e \u003cp\u003eAcknowledgments 94\u003c\/p\u003e \u003cp\u003eReferences 94\u003c\/p\u003e \u003cp\u003e\u003cb\u003e4 Nd-Doped Laser Phosphate Glass 99\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eTayyab I. Suratwala and Paul Ehrmann\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e4.1 Introduction 99\u003c\/p\u003e \u003cp\u003e4.2 Glass Composition and Properties 100\u003c\/p\u003e \u003cp\u003e4.3 Continuous Melting 102\u003c\/p\u003e \u003cp\u003e4.4 OH Content 105\u003c\/p\u003e \u003cp\u003e4.5 Fracture 109\u003c\/p\u003e \u003cp\u003e4.5.1 Slow Crack Growth 109\u003c\/p\u003e \u003cp\u003e4.5.2 Surface Tension via OH Diffusion 112\u003c\/p\u003e \u003cp\u003e4.6 Corrosion Resistance 115\u003c\/p\u003e \u003cp\u003e4.6.1 Weathering 115\u003c\/p\u003e \u003cp\u003e4.6.2 Haze: Ceria Reactivity with Surface 119\u003c\/p\u003e \u003cp\u003e4.7 Pt Inclusions 122\u003c\/p\u003e \u003cp\u003e4.8 Impurities 124\u003c\/p\u003e \u003cp\u003e4.9 Glass Quality, Selection Rules, and Performance 126\u003c\/p\u003e \u003cp\u003eAcknowledgments 130\u003c\/p\u003e \u003cp\u003eReferences 130\u003c\/p\u003e \u003cp\u003e\u003cb\u003e5 KDP and DKDP Crystals 135\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eKathleen I. Schaffers and Tayyab I. Suratwala\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e5.1 Introduction 135\u003c\/p\u003e \u003cp\u003e5.2 Crystal Composition and Properties 136\u003c\/p\u003e \u003cp\u003e5.3 KDP and DKDP Growth Technologies 138\u003c\/p\u003e \u003cp\u003e5.4 Technical Challenges 142\u003c\/p\u003e \u003cp\u003e5.4.1 Crystal Growth to Large Size 142\u003c\/p\u003e \u003cp\u003e5.4.2 D\/H Exchange (E-Cracking) 145\u003c\/p\u003e \u003cp\u003e5.4.3 Reaction with Humidity (Etch Pits) 148\u003c\/p\u003e \u003cp\u003e5.4.4 Laser-Induced Surface Roughening in a Vacuum 151\u003c\/p\u003e \u003cp\u003e5.4.5 Fracture 152\u003c\/p\u003e \u003cp\u003e5.4.6 Liquid Inclusions 155\u003c\/p\u003e \u003cp\u003e5.4.7 Bulk Laser Damage and Laser Conditioning 156\u003c\/p\u003e \u003cp\u003e5.5 Summary 159\u003c\/p\u003e \u003cp\u003eAcknowledgments 159\u003c\/p\u003e \u003cp\u003eReferences 159\u003c\/p\u003e \u003cp\u003e\u003cb\u003e6 3ω Finishing 163\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eTayyab I. Suratwala\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e6.1 Sub-surface Mechanical Damage 164\u003c\/p\u003e \u003cp\u003e6.1.1 Grinding SSD Management 164\u003c\/p\u003e \u003cp\u003e6.1.2 Polishing SSD Management 167\u003c\/p\u003e \u003cp\u003e6.1.3 Scratch Forensics 170\u003c\/p\u003e \u003cp\u003e6.2 Role of Chemical Etching 172\u003c\/p\u003e \u003cp\u003e6.2.1 Strip Etch 173\u003c\/p\u003e \u003cp\u003e6.2.2 Bulk Etching 174\u003c\/p\u003e \u003cp\u003e6.2.3 Chemical Impurity Removal 178\u003c\/p\u003e \u003cp\u003e6.3 Strategy for 3ω Finishing and Production Impact 178\u003c\/p\u003e \u003cp\u003eReferences 180\u003c\/p\u003e \u003cp\u003e\u003cb\u003ePart II Optic Laser-Induced Damage Reduction Technologies 183\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e\u003cb\u003e7 Laser-Induced Damage Mechanisms 185\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eC. Wren Carr\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e7.1 Laser-Induced Damage Process and Location Implications 185\u003c\/p\u003e \u003cp\u003e7.2 Initial Absorption 187\u003c\/p\u003e \u003cp\u003e7.3 Types of Laser-Induced Damage 188\u003c\/p\u003e \u003cp\u003e7.3.1 Gray Haze 188\u003c\/p\u003e \u003cp\u003e7.3.2 Exit Surface Damage on SiO 2 Glass 189\u003c\/p\u003e \u003cp\u003e7.3.3 Bulk Damage in KDP and DKDP 191\u003c\/p\u003e \u003cp\u003e7.3.4 Damage in MLD Coatings 193\u003c\/p\u003e \u003cp\u003e7.4 Initial Absorption Mechanisms 194\u003c\/p\u003e \u003cp\u003e7.4.1 Initial Absorption by Intrinsic Mechanisms 194\u003c\/p\u003e \u003cp\u003e7.4.2 Initial Absorption by Extrinsic Mechanisms 196\u003c\/p\u003e \u003cp\u003e7.5 Secondary Absorption 201\u003c\/p\u003e \u003cp\u003e7.6 Material Response 205\u003c\/p\u003e \u003cp\u003e7.6.1 Material Response After Damage 205\u003c\/p\u003e \u003cp\u003e7.6.2 Material Response Without Damage 210\u003c\/p\u003e \u003cp\u003eReferences 210\u003c\/p\u003e \u003cp\u003e\u003cb\u003e8 Laser-Damage Measurement and Analysis Methods 215\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eDavid A. Cross and C. Wren Carr\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e8.1 Introduction 215\u003c\/p\u003e \u003cp\u003e8.1.1 Why Are Laser-Damage Measurements Needed? 215\u003c\/p\u003e \u003cp\u003e8.1.2 Misconceptions Concerning Laser Damage 216\u003c\/p\u003e \u003cp\u003e8.2 Measurement 219\u003c\/p\u003e \u003cp\u003e8.2.1 Material Laser Exposure 219\u003c\/p\u003e \u003cp\u003e8.2.2 Material Response 221\u003c\/p\u003e \u003cp\u003e8.3 Analysis 223\u003c\/p\u003e \u003cp\u003e8.3.1 Multimodal Registration 223\u003c\/p\u003e \u003cp\u003e8.3.2 Damage-Initiation Measurements 227\u003c\/p\u003e \u003cp\u003e8.3.3 Damage-Growth Measurements 232\u003c\/p\u003e \u003cp\u003eReferences 237\u003c\/p\u003e \u003cp\u003e\u003cb\u003e9 Parameters Affecting Laser-Induced Damage Initiation and Growth 241\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eRaluca A. Negres and C. Wren Carr\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e9.1 Introduction 241\u003c\/p\u003e \u003cp\u003e9.2 Initiation 243\u003c\/p\u003e \u003cp\u003e9.2.1 Fluence, Wavelength, and Optic Quality 244\u003c\/p\u003e \u003cp\u003e9.2.2 Pulse Length and Shape 245\u003c\/p\u003e \u003cp\u003e9.2.2.1 Nanosecond Pulse-Width Regime 245\u003c\/p\u003e \u003cp\u003e9.2.2.2 Picosecond Pulse-Width Regime 247\u003c\/p\u003e \u003cp\u003e9.3 Growth 248\u003c\/p\u003e \u003cp\u003e9.3.1 Multi-shot Growth Behaviors 249\u003c\/p\u003e \u003cp\u003e9.3.1.1 Fluence, Wavelength, and Location 249\u003c\/p\u003e \u003cp\u003e9.3.1.2 Multi-wavelength Irradiation 250\u003c\/p\u003e \u003cp\u003e9.3.2 Single-Shot Growth Behaviors 251\u003c\/p\u003e \u003cp\u003e9.3.2.1 Probability of Growth 253\u003c\/p\u003e \u003cp\u003e9.3.2.2 Growth Rate 257\u003c\/p\u003e \u003cp\u003e9.4 Summary 261\u003c\/p\u003e \u003cp\u003eReferences 262\u003c\/p\u003e \u003cp\u003e\u003cb\u003e10 Advanced Mitigation Process (AMP) 267\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eDiana VanBlarcom\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e10.1 Introduction 267\u003c\/p\u003e \u003cp\u003e10.2 Development of the AMP Process 268\u003c\/p\u003e \u003cp\u003e10.2.1 Etching to Mitigate Scratches 269\u003c\/p\u003e \u003cp\u003e10.2.2 Etching to Mitigate Chemical Impurities 273\u003c\/p\u003e \u003cp\u003e10.3 Production Implementation 277\u003c\/p\u003e \u003cp\u003e10.3.1 AMP Station 277\u003c\/p\u003e \u003cp\u003e10.3.2 AMP Recipes 278\u003c\/p\u003e \u003cp\u003e10.3.3 Post-AMP Surface Degradations 279\u003c\/p\u003e \u003cp\u003e10.3.4 AMP Production Rates 281\u003c\/p\u003e \u003cp\u003e10.3.5 Quality Assurance and Safety 282\u003c\/p\u003e \u003cp\u003e10.4 Conclusions and the Future of AMP 283\u003c\/p\u003e \u003cp\u003eReferences 283\u003c\/p\u003e \u003cp\u003e\u003cb\u003e11 Debris-Induced Damage Reduction on 3ω-Fused-Silica Optics 285\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eRajesh N. Raman, Christopher F. Miller, and C. Wren Carr\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e11.1 Evidence of a New Damage Source 285\u003c\/p\u003e \u003cp\u003e11.1.1 High Online Damage Initiation Rates After AMP 285\u003c\/p\u003e \u003cp\u003e11.1.2 Damage Spatial Distribution 286\u003c\/p\u003e \u003cp\u003e11.1.3 Debris on Optic and Damage Morphology 288\u003c\/p\u003e \u003cp\u003e11.1.4 Debris Morphology and Composition 290\u003c\/p\u003e \u003cp\u003e11.2 Sources of Debris 292\u003c\/p\u003e \u003cp\u003e11.3 Physics of Debris-Induced Laser Damage 293\u003c\/p\u003e \u003cp\u003e11.3.1 Deposition Mechanism 293\u003c\/p\u003e \u003cp\u003e11.3.2 Material Type 296\u003c\/p\u003e \u003cp\u003e11.3.3 Fluence and Particle Size 302\u003c\/p\u003e \u003cp\u003e11.4 Mitigation of Debris-Induced Damage and Impact 303\u003c\/p\u003e \u003cp\u003e11.4.1 Antireflection Coating on Grating Surface of GDS 304\u003c\/p\u003e \u003cp\u003e11.4.2 Fused-Silica Debris Shield (FSDS) to Protect GDS 305\u003c\/p\u003e \u003cp\u003e11.4.3 Metal Barriers to Block Debris Transit 307\u003c\/p\u003e \u003cp\u003e11.4.4 Laser Cleaning 308\u003c\/p\u003e \u003cp\u003eReferences 309\u003c\/p\u003e \u003cp\u003e\u003cb\u003e12 Silica Sol–Gel Antireflective Coatings 311\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eStephenH.Mezyk\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e12.1 Introduction 311\u003c\/p\u003e \u003cp\u003e12.2 Single Layer Antireflective Optical Coatings 313\u003c\/p\u003e \u003cp\u003e12.3 Stöber Silica Sol–Gel 315\u003c\/p\u003e \u003cp\u003e12.4 Chemically Processing Stöber Silica for Enhanced Mechanical and Environmental Stability 316\u003c\/p\u003e \u003cp\u003e12.5 Wet-Film Deposition Processes 319\u003c\/p\u003e \u003cp\u003e12.6 Ellipsometry for Process Control 320\u003c\/p\u003e \u003cp\u003e12.7 Volume Production of Sol–Gel Thin Films 323\u003c\/p\u003e \u003cp\u003e12.8 Conclusion 325\u003c\/p\u003e \u003cp\u003eReferences 326\u003c\/p\u003e \u003cp\u003e\u003cb\u003e13 Multilayer Dielectric Coatings 329\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eColin M. Harthcock\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e13.1 Introduction 329\u003c\/p\u003e \u003cp\u003e13.2 MLD Design Fundamentals 329\u003c\/p\u003e \u003cp\u003e13.2.1 Complex Index and Reflectivity 330\u003c\/p\u003e \u003cp\u003e13.2.2 Admittance of Optical Thin Films 331\u003c\/p\u003e \u003cp\u003e13.2.3 MLD Coating-Design Examples 334\u003c\/p\u003e \u003cp\u003e13.2.4 Polarization and Angle of Incidence 337\u003c\/p\u003e \u003cp\u003e13.3 Laser-Damage Resistance 340\u003c\/p\u003e \u003cp\u003e13.3.1 Electrical-Field Intensification 340\u003c\/p\u003e \u003cp\u003e13.3.2 Optical Bandgap 342\u003c\/p\u003e \u003cp\u003e13.3.3 Absorbing Precursors and Their Mitigations 345\u003c\/p\u003e \u003cp\u003e13.3.3.1 Molecular and Atomic-Level Precursors 345\u003c\/p\u003e \u003cp\u003e13.3.3.2 Within Coating Particulate Precursors 348\u003c\/p\u003e \u003cp\u003e13.3.3.3 Foreign-Object Debris Precursors 350\u003c\/p\u003e \u003cp\u003e13.4 Coating Structure and Deposition Energetics 356\u003c\/p\u003e \u003cp\u003e13.5 Coating Deposition Process Variables and Methods 359\u003c\/p\u003e \u003cp\u003eReferences 362\u003c\/p\u003e \u003cp\u003e\u003cb\u003e14 Optics Recycle Loop 367\u003cbr\u003e \u003c\/b\u003e\u003ci\u003ePamela K. Whitman and Brian J. Welday\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e14.1 Operation Strategy 367\u003c\/p\u003e \u003cp\u003e14.2 Enabling Technologies 372\u003c\/p\u003e \u003cp\u003e14.3 Optics Recycle Loop Process 373\u003c\/p\u003e \u003cp\u003e14.4 Models to Describe the Optics Recycle Loop 380\u003c\/p\u003e \u003cp\u003e14.4.1 Growth Rate of Fused-Silica Glass Damage 381\u003c\/p\u003e \u003cp\u003e14.4.2 Analytical Model of Optics Exchange Rate 382\u003c\/p\u003e \u003cp\u003e14.4.3 System Initiation Rate 383\u003c\/p\u003e \u003cp\u003e14.4.4 Multi-loop Model 384\u003c\/p\u003e \u003cp\u003e14.5 Historical Performance and Tailorability 386\u003c\/p\u003e \u003cp\u003e14.6 Summary 390\u003c\/p\u003e \u003cp\u003eAcknowledgments 390\u003c\/p\u003e \u003cp\u003eReferences 392\u003c\/p\u003e \u003cp\u003e\u003cb\u003ePart III Optic Recycle Loop Technologies 395\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e\u003cb\u003e15 Custom Processing Equipment 397\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eVaughn E. Van Note and Henry A. Hui\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e15.1 Introduction 397\u003c\/p\u003e \u003cp\u003e15.2 Systems Engineering Approach 398\u003c\/p\u003e \u003cp\u003e15.3 Integrated Product Review Board 400\u003c\/p\u003e \u003cp\u003e15.3.1 Failure Modes and Effects Analysis 402\u003c\/p\u003e \u003cp\u003e15.3.2 Concept of Operations 404\u003c\/p\u003e \u003cp\u003e15.3.3 Work Authorization Process 405\u003c\/p\u003e \u003cp\u003e15.4 Advanced Mitigation Process (AMP) Station 406\u003c\/p\u003e \u003cp\u003e15.5 Meniscus Coaters 409\u003c\/p\u003e \u003cp\u003e15.6 Diffractive Optic Full Aperture System Test (DOFAST) 411\u003c\/p\u003e \u003cp\u003e15.7 Assembly Stations 413\u003c\/p\u003e \u003cp\u003e15.8 GDS Imprinting System 416\u003c\/p\u003e \u003cp\u003e15.9 Sustaining Capabilities and the Future 418\u003c\/p\u003e \u003cp\u003eAcknowledgments 421\u003c\/p\u003e \u003cp\u003eReferences 421\u003c\/p\u003e \u003cp\u003e\u003cb\u003e16 Optics Inspection and Data Management 423\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eLaura M. Kegelmeyer\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e16.1 Optics Inspection Camera Systems on NIF 423\u003c\/p\u003e \u003cp\u003e16.1.1 SIDE System for Imaging the Target Chamber Vacuum Window 425\u003c\/p\u003e \u003cp\u003e16.1.2 LOIS for Imaging Main Laser Optics and Switchyard Mirrors 425\u003c\/p\u003e \u003cp\u003e16.1.3 FODI for Imaging Final Optics and Some Switchyard Mirrors 428\u003c\/p\u003e \u003cp\u003e16.2 Finding, Identifying, and Tracking Damage on NIF Optics 430\u003c\/p\u003e \u003cp\u003e16.2.1 Image Analysis and Machine Learning 431\u003c\/p\u003e \u003cp\u003e16.2.2 Fiducials and Defect Tracking Through Time and Space 436\u003c\/p\u003e \u003cp\u003e16.3 Data Management and Applications 438\u003c\/p\u003e \u003cp\u003e16.3.1 Integrated Analyses, Databases, and Reporting 438\u003c\/p\u003e \u003cp\u003e16.3.2 Tools for Data Visualization 440\u003c\/p\u003e \u003cp\u003e16.4 Summary 442\u003c\/p\u003e \u003cp\u003eAcknowledgments 442\u003c\/p\u003e \u003cp\u003eReferences 443\u003c\/p\u003e \u003cp\u003e\u003cb\u003e17 Online Programmable Shadow Blockers 445\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eRajesh N. Raman, Tayyab I. Suratwala, and Pamela K. Whitman\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e17.1 Programmable Spatial Shaper Device Capability 446\u003c\/p\u003e \u003cp\u003e17.2 Blocker Deployment and Optic Exchange 446\u003c\/p\u003e \u003cp\u003e17.3 Blocker Constraints 449\u003c\/p\u003e \u003cp\u003e17.4 Blocker Distribution Optimization 451\u003c\/p\u003e \u003cp\u003e17.5 Production Metrics and Historical Behavior 454\u003c\/p\u003e \u003cp\u003eReferences 455\u003c\/p\u003e \u003cp\u003e\u003cb\u003e18 Optic Metrology 457\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eMike C. Nostrand\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e18.1 Full-Aperture Tools 459\u003c\/p\u003e \u003cp\u003e18.1.1 Defects in the Antireflective coating using FADLiB 459\u003c\/p\u003e \u003cp\u003e18.1.2 Surface Damage and Digs Using DMS 460\u003c\/p\u003e \u003cp\u003e18.1.3 Surface Phase Objects 462\u003c\/p\u003e \u003cp\u003e18.1.4 General Surface Features Using TID 463\u003c\/p\u003e \u003cp\u003e18.1.5 Diffraction-Grating Efficiency and Uniformity Using DOFAST 464\u003c\/p\u003e \u003cp\u003e18.2 Sub-aperture Tools 468\u003c\/p\u003e \u003cp\u003e18.2.1 Phase and Amplitude of Phase Objects Using PSDI 468\u003c\/p\u003e \u003cp\u003e18.2.2 Downstream Modulation Using MMS 470\u003c\/p\u003e \u003cp\u003e18.2.3 Removing Coating Defects from Crystals Using FLRT 470\u003c\/p\u003e \u003cp\u003e18.2.4 Crystal Phase-Matching Angles Using CATS 472\u003c\/p\u003e \u003cp\u003e18.2.5 Threat-Determination Software 473\u003c\/p\u003e \u003cp\u003e18.3 Commercial Tools 474\u003c\/p\u003e \u003cp\u003e18.3.1 Full-Aperture Tools 474\u003c\/p\u003e \u003cp\u003e18.3.2 Reflected and Transmitted Wave Front 474\u003c\/p\u003e \u003cp\u003e18.3.3 Sub-aperture Tools 475\u003c\/p\u003e \u003cp\u003e18.3.4 Optical-Surface Profiling 475\u003c\/p\u003e \u003cp\u003e18.3.5 Optical Microscopy 475\u003c\/p\u003e \u003cp\u003e18.3.6 Ellipsometry 477\u003c\/p\u003e \u003cp\u003e18.4 Summary 478\u003c\/p\u003e \u003cp\u003eReferences 479\u003c\/p\u003e \u003cp\u003e\u003cb\u003e19 Repair of Flaws and Laser-Induced Damage 481\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eIsaac L. Bass, Todd Noste, and Scott K. Trummer\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e19.1 Laser-Damage Repair on Fused Silica 481\u003c\/p\u003e \u003cp\u003e19.1.1 Damage-Mitigation Requirements 483\u003c\/p\u003e \u003cp\u003e19.1.2 Stationary-Beam Mitigation 484\u003c\/p\u003e \u003cp\u003e19.1.3 Moving-Beam Mitigation 485\u003c\/p\u003e \u003cp\u003e19.1.4 Rapid Ablation Mitigation 486\u003c\/p\u003e \u003cp\u003e19.1.5 RAM Applied to Exit-Surface Damage 489\u003c\/p\u003e \u003cp\u003e19.1.6 On-Axis Downstream Intensification from Exit-Surface RAM Cones 490\u003c\/p\u003e \u003cp\u003e19.1.7 Damage Resistance of RAM Cones 491\u003c\/p\u003e \u003cp\u003e19.1.8 Managing Redeposit from RAM Cones 493\u003c\/p\u003e \u003cp\u003e19.1.9 Residual Stress from RAM Cones 496\u003c\/p\u003e \u003cp\u003e19.1.10 RAM Applied to Input Surface Damage 497\u003c\/p\u003e \u003cp\u003e19.1.11 RAM Applied to AR-Coated GDSs 501\u003c\/p\u003e \u003cp\u003e19.1.12 RAM Cones Contribution to Obscuration 504\u003c\/p\u003e \u003cp\u003e19.1.13 Reliability, Availability, and Maintainability of Mitigation Equipment 504\u003c\/p\u003e \u003cp\u003e19.1.14 Investigation of Mitigation at 4.6-μm Wavelength 505\u003c\/p\u003e \u003cp\u003e19.2 Laser-Damage Initiation-Site Repair on KDP Crystals 505\u003c\/p\u003e \u003cp\u003e19.2.1 Anatomy of a KDP Mitigation Site 506\u003c\/p\u003e \u003cp\u003e19.2.2 Ductile Machining of KDP 508\u003c\/p\u003e \u003cp\u003e19.2.3 Crystal Mitigation Station 508\u003c\/p\u003e \u003cp\u003e19.2.4 Commissioning the CMS and Mitigation Sites 510\u003c\/p\u003e \u003cp\u003e19.2.5 KDP Damage-Site Mitigation Challenges 514\u003c\/p\u003e \u003cp\u003e19.2.6 Future Efforts and Upgrades 515\u003c\/p\u003e \u003cp\u003eAcknowledgments 515\u003c\/p\u003e \u003cp\u003eReferences 515\u003c\/p\u003e \u003cp\u003e\u003cb\u003e20 Laser-Induced Damage Repair Automation 521\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eScott K. Trummer\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e20.1 Repair Process for 3ω Fused-Silica Optics 521\u003c\/p\u003e \u003cp\u003e20.1.1 Preprocessing 522\u003c\/p\u003e \u003cp\u003e20.1.2 Software Setup 523\u003c\/p\u003e \u003cp\u003e20.1.3 Optic Registration 523\u003c\/p\u003e \u003cp\u003e20.1.4 Pre-mitigation Inspection 523\u003c\/p\u003e \u003cp\u003e20.1.5 Mitigation and Post-mitigation Analysis 524\u003c\/p\u003e \u003cp\u003e20.1.6 Postprocessing and Data Export 524\u003c\/p\u003e \u003cp\u003e20.2 OMF Automation 524\u003c\/p\u003e \u003cp\u003e20.2.1 Data Handling and Expanded Software Capabilities 525\u003c\/p\u003e \u003cp\u003e20.2.2 Pre-mitigation Inspection and Protocol Assignment 527\u003c\/p\u003e \u003cp\u003e20.2.3 Mitigation and Post-mitigation Inspection 534\u003c\/p\u003e \u003cp\u003e20.2.4 Limitations of Automation 537\u003c\/p\u003e \u003cp\u003e20.3 Production Metrics 539\u003c\/p\u003e \u003cp\u003eReferences 541\u003c\/p\u003e \u003cp\u003e\u003cb\u003e21 Laser-Induced Damage Identification Using AI 543\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eChristopher F. Miller and David A. Cross\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e21.1 Improving Lifetime of Recycled Optics 544\u003c\/p\u003e \u003cp\u003e21.2 The All Microscopy Hitlist (AMH) 545\u003c\/p\u003e \u003cp\u003e21.2.1 Requirements and Process Strategy 546\u003c\/p\u003e \u003cp\u003e21.2.2 Optic Verification and Large-Optic Scan 547\u003c\/p\u003e \u003cp\u003e21.2.3 Optic Montage Analysis 550\u003c\/p\u003e \u003cp\u003e21.2.3.1 Feature Finding 551\u003c\/p\u003e \u003cp\u003e21.2.3.2 Large-Feature Analysis 552\u003c\/p\u003e \u003cp\u003e21.2.4 Small-Site Inspection and Classification 555\u003c\/p\u003e \u003cp\u003e21.3 Maximizing the Utility of Optic Repairs 556\u003c\/p\u003e \u003cp\u003e21.3.1 Optic Triaging 556\u003c\/p\u003e \u003cp\u003e21.3.2 End-of-Life Optics 557\u003c\/p\u003e \u003cp\u003eReferences 558\u003c\/p\u003e \u003cp\u003e\u003cb\u003e22 On-Optic Shadow Cone Blockers 561\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eEyal Feigenbaum, Allison E. Browar, Isaac L. Bass, and Rajesh N. Raman\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e22.1 Inherent Advantages and Challenges 561\u003c\/p\u003e \u003cp\u003e22.1.1 On-Optics Shadowing Approach and Its Advantages 561\u003c\/p\u003e \u003cp\u003e22.1.2 The SCB-Resulting Expanding Wave and Subsequent Exit Surface Damage 564\u003c\/p\u003e \u003cp\u003e22.1.3 Size Limitations on the Diameter of Conic-Shaped SCB 567\u003c\/p\u003e \u003cp\u003e22.2 Approaches for Implementation of Larger SCBs 569\u003c\/p\u003e \u003cp\u003e22.2.1 Rounded Sidewalls SCB 570\u003c\/p\u003e \u003cp\u003e22.2.2 Larger Shadowed Area Using SCB Arrays 576\u003c\/p\u003e \u003cp\u003e22.3 Utilization and Application Considerations 578\u003c\/p\u003e \u003cp\u003e22.3.1 FODI “Bleeding” and Potential Solutions 579\u003c\/p\u003e \u003cp\u003e22.3.2 Implementation and Testing of SCB Online 580\u003c\/p\u003e \u003cp\u003eReferences 586\u003c\/p\u003e \u003cp\u003e\u003cb\u003e23 Contamination Management from Nonoptical Materials 587\u003cbr\u003e \u003c\/b\u003e\u003ci\u003eLiang-Yu Chen and Tayyab I. Suratwala\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e23.1 Particle Debris and Residue 588\u003c\/p\u003e \u003cp\u003e23.1.1 Surface-Particle Cleanliness Measurement 588\u003c\/p\u003e \u003cp\u003e23.1.2 Nonvolatile Residue (NVR) Measurement 589\u003c\/p\u003e \u003cp\u003e23.1.3 Gross and Precision Cleaning 591\u003c\/p\u003e \u003cp\u003e23.2 Airborne Molecular Contaminants (AMCs) 594\u003c\/p\u003e \u003cp\u003e23.2.1 Vacuum-Outgas Test 594\u003c\/p\u003e \u003cp\u003e23.2.2 High-Temperature Bakeout to Remove Volatile Organics 601\u003c\/p\u003e \u003cp\u003e23.2.3 Polymer Example: Silicone 603\u003c\/p\u003e \u003cp\u003e23.3 Summary 605\u003c\/p\u003e \u003cp\u003eAcknowledgments 606\u003c\/p\u003e \u003cp\u003eReferences 606\u003c\/p\u003e \u003cp\u003eIndex 609\u003c\/p\u003e  \u003cp\u003e\u003cb\u003eTayyab I. Suratwala, PhD,\u003c\/b\u003e is the Program Director for Optics and Materials Science \u0026amp; Technology (OMST) in the NIF \u0026amp; Photon Science Directorate at Lawrence Livermore National Laboratory (LLNL). He has 28 years of experience in optical fabrication and materials processing. \u003c\/p\u003e\u003cp\u003e\u003cb\u003eC. Wren Carr, PhD,\u003c\/b\u003e is a Group Leader for Science \u0026amp; Technology for OMST at LLNL. He has 25 years of experience in the field of laser-induced damage in optical materials. \u003c\/p\u003e\u003cp\u003e\u003cb\u003eChristopher J. Stolz\u003c\/b\u003e is the former Group Leader for Optics Supply for OMST at LLNL. He has 36 years of experience in high fluence multilayer optical coatings and optical fabrication.   \u003c\/p\u003e\u003cp\u003e\u003cb\u003eA powerful and up-to-date desk reference for advancements in optic technologies for high energy lasers\u003c\/b\u003e \u003c\/p\u003e\u003cp\u003eIn \u003ci\u003eOptic Technologies Enabling Fusion Ignition,\u003c\/i\u003e a team of veteran optics and laser specialists deliver an expert summary of optic manufacturing technologies, laser-induced optic damage reduction technologies, and optic repair \u0026amp; recycle technologies. The authors explore the fundamental scientific phenomena and how they have driven the development of optic technologies as well as the process of transitioning from scientific discovery to large-scale production. \u003c\/p\u003e\u003cp\u003eThe book combines examinations of improving overall optic performance, optic survivability, and laser performance. It also covers novel bulk material developments, yield processing improvement methods, novel metrologies, and advancements in increasing laser-induced damage resistance. \u003c\/p\u003e\u003cp\u003eReaders will also find: \u003c\/p\u003e\u003cul\u003e\n\u003cli\u003eA thorough introduction to the details of optics recycle loop technologies, including the refurbishment and repair of laser-induced damaged optics\u003c\/li\u003e\n\u003cli\u003eComprehensive explorations of advancements in optical fabrication and post-processing reducing laser damaging surface precursors\u003c\/li\u003e\n\u003cli\u003ePractical discussions of the fundamental physics of laser-matter interactions related to laser-induced damage\u003c\/li\u003e\n\u003cli\u003eComplete treatments of laser-induced damage data management, the use of online shadow blockers, and novel optics metrologies\u003c\/li\u003e\n\u003c\/ul\u003e \u003cp\u003eIdeal for optical and laser scientists, engineers, and fabricators of optical materials and components, \u003ci\u003eOptic Technologies Enabling Fusion Ignition\u003c\/i\u003e is also a valuable resource for graduate students interested in optics, as well as high-energy and high-power laser research.\u003c\/p\u003e","brand":"Wiley","offers":[{"title":"Default Title","offer_id":47989719859429,"sku":"NP9781394268245","price":225.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/1842\/7735\/files\/9781394268245.jpg?v=1761785237","url":"https:\/\/k12savings.com\/products\/optic-technologies-enabling-fusion-ignition-isbn-9781394268245","provider":"K12savings","version":"1.0","type":"link"}