{"product_id":"digital-systems-testing-and-testable-design-isbn-9780780310629","title":"Digital Systems Testing and Testable Design","description":"This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.  Preface.\u003cbr\u003e \u003cbr\u003e How This Book Was Written.\u003cbr\u003e \u003cbr\u003e Introduction.\u003cbr\u003e \u003cbr\u003e Modeling.\u003cbr\u003e \u003cbr\u003e Logic Simulation.\u003cbr\u003e \u003cbr\u003e Fault Modeling.\u003cbr\u003e \u003cbr\u003e Fault Simulation.\u003cbr\u003e \u003cbr\u003e Testing For Single Stuck Faults.\u003cbr\u003e \u003cbr\u003e Testing For Bridging Faults.\u003cbr\u003e \u003cbr\u003e Functional Testing.\u003cbr\u003e \u003cbr\u003e Design For Testability.\u003cbr\u003e \u003cbr\u003e Compression Techniques.\u003cbr\u003e \u003cbr\u003e Built-In Self-Test.\u003cbr\u003e \u003cbr\u003e Logic-Level Diagnosis.\u003cbr\u003e \u003cbr\u003e Self-Checking Design.\u003cbr\u003e \u003cbr\u003e PLA Testing.\u003cbr\u003e \u003cbr\u003e System-Level Diagnosis.\u003cbr\u003e \u003cbr\u003e Index. \u003cp\u003e\u003cb\u003eMiron Abramovici\u003c\/b\u003e is a Distinguished Member of the Technical Staff at AT\u0026amp;T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eMelvin A. Breuer\u003c\/b\u003e is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eArthur D. Friedman\u003c\/b\u003e is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.\u003cbr\u003eAll three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.\u003c\/p\u003e  This widely-used textbook provides comprehensive, state-of-the-art coverage of digital systems testing and testable design.  \u003cp\u003eConsidered a definitive text in this area, the book includes in-depth discussions of the following topics:\u003c\/p\u003e \u003cp\u003eTest generation\u003cbr\u003e Fault modeling for classic and new technologies\u003cbr\u003e Simulation\u003cbr\u003e Fault simulation\u003cbr\u003e Design for testability\u003cbr\u003e Built-in self-test Diagnosis\u003c\/p\u003e \u003cp\u003eAll topics are covered extensively, from fundamental concepts to advanced techniques.\u003c\/p\u003e \u003cp\u003eSuccessfully used world-wide at leading universities, the book is appropriate for graduate-level and senior-level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.\u003c\/p\u003e","brand":"Wiley-IEEE Press","offers":[{"title":"Default Title","offer_id":47989069250789,"sku":"NP9780780310629","price":217.95,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/1842\/7735\/files\/9780780310629.jpg?v=1761782667","url":"https:\/\/k12savings.com\/products\/digital-systems-testing-and-testable-design-isbn-9780780310629","provider":"K12savings","version":"1.0","type":"link"}