{"product_id":"accelerated-stress-testing-handbook-isbn-9780780360259","title":"Accelerated Stress Testing Handbook","description":"As we move closer to a genuinely global economy, the pressure to develop highly reliable products on ever-tighter schedules will increase. Part of a designer's \"toolbox\" for achieving product reliability in a compressed time frame should be a set of best practices for utilizing accelerated stress testing (AST).  \u003cp\u003e\u003ci\u003eThe Accelerated Stress Testing Handbook\u003c\/i\u003e delineates a core set of AST practices as part of an overall methodology for enhancing hardware product reliability. The techniques presented will teach readers to identify design deficiencies and problems with component quality or manufacturing processes early in the product's life, and then to take corrective action as quickly as possible. A wide array of case studies gleaned from leading practitioners of AST supplement the theory and methodology, which will provide the reader with a more concrete idea of how AST truly enhances quality in a reduced time frame.\u003c\/p\u003e \u003cp\u003eImportant topics covered include:\u003c\/p\u003e \u003cul\u003e \u003cli\u003eTheoretical basis for AST\u003c\/li\u003e \u003cli\u003eGeneral AST best practices\u003c\/li\u003e \u003cli\u003eAST design and manufacturing processes\u003c\/li\u003e \u003cli\u003eAST equipment and techniques\u003c\/li\u003e \u003cli\u003eAST process safety qualification\u003c\/li\u003e \u003c\/ul\u003e In this handbook, AST cases studies demonstrate thermal, vibration, electrical, and liquid stress application; failure mode analysis; and corrective action techniques. Individuals who would be interested in this book include: reliability engineers and researchers, mechanical and electrical engineers, those involved with all facets of electronics and telecommunications product design and manufacturing, and people responsible for implementing quality and process improvement programs.  Foerword (F. Ianna).\u003cbr\u003e \u003cbr\u003e Preface.\u003cbr\u003e \u003cbr\u003e Acknowledgments.\u003cbr\u003e \u003cbr\u003e OVERVIEW.\u003cbr\u003e \u003cbr\u003e Introduction (H. Chan and P. Englert).\u003cbr\u003e \u003cbr\u003e Principles of Stress Testing (H. Chan and P. Englert).\u003cbr\u003e \u003cbr\u003e PROCESS AND GUIDELINES.\u003cbr\u003e \u003cbr\u003e Stress Testing Program: Generic Processes (H. Chan and P. Englert).\u003cbr\u003e \u003cbr\u003e Stress Testing Program Subprocesses (H. Chan and P. Englert).\u003cbr\u003e \u003cbr\u003e Guidelines for Design and Manufacturing Stress Testing (H. Chan and P. Englert).\u003cbr\u003e \u003cbr\u003e THEORY.\u003cbr\u003e \u003cbr\u003e Economic and Optimization (H. Chan and P. Englert).\u003cbr\u003e \u003cbr\u003e Reliability Growth (C. Seusy).\u003cbr\u003e \u003cbr\u003e Overview of the Failure Analysis Process for Electrical Components (G. Pfeiffer).\u003cbr\u003e \u003cbr\u003e EQUIPMENT AND TECHNIQUES.\u003cbr\u003e \u003cbr\u003e Accelerated Stress Testing Equipment and Techniques (C. Felkins).\u003cbr\u003e \u003cbr\u003e Vibration and Shock Inputs Identify Some Failure Modes (W. Tustin).\u003cbr\u003e \u003cbr\u003e Relative Effectiveness of Thermal Cycling Versus Burn-In (K. Lo and F. LoVasco).\u003cbr\u003e \u003cbr\u003e Accelerated Qualification of Electronic Assemblies Under Combined Temperature Cycling and Vibration Environments: Is Miner's Hypothesis Valid (K. Upadhyayula and A. Dasgupta)?\u003cbr\u003e \u003cbr\u003e Liquid Environmental Stress Testing (LEST) (P. Englert).\u003cbr\u003e \u003cbr\u003e Safety Qualification of Stress Testing (S. Rajaram).\u003cbr\u003e \u003cbr\u003e BEST PRACTICES CASE STUDIES IN COMPUTER, COMMUNICATIONS, AND OTHER INDUSTRIES.\u003cbr\u003e \u003cbr\u003e Production Ast with Computers Using the Taguchi Method (D. Pachuki).\u003cbr\u003e \u003cbr\u003e Design Ast with Vendor Electronics (C. Schinner).\u003cbr\u003e \u003cbr\u003e Design and Production Ast with Power Supplies (D. Dalland).\u003cbr\u003e \u003cbr\u003e Design and Production Ast with Computers (E. Kyser).\u003cbr\u003e \u003cbr\u003e Qualifications and Production Sampling Ast with Printed Circuit Boards (H. McLean).\u003cbr\u003e \u003cbr\u003e Manufacturing Ast with Telecommunication Products (T. Parker and G. Harrison).\u003cbr\u003e \u003cbr\u003e Productionn Ast with Computer Disks.\u003cbr\u003e \u003cbr\u003e Benchmarking (H. Malec).\u003cbr\u003e \u003cbr\u003e Glossary of Stress Testing Terminology.\u003cbr\u003e \u003cbr\u003e Bibliography.\u003cbr\u003e \u003cbr\u003e Index.\u003cbr\u003e \u003cbr\u003e Epilogue.\u003cbr\u003e \u003cbr\u003e About the Editors. \"This is a most thorough and up-to-date handbook...I highly recommend it to all readers in this field of interest...\" (IEEE Instrumentation and Measurement Magazine, December 2001)  About the Editors H. Anthony Chan has been with AT\u0026amp;T Labs and the former AT\u0026amp;T Bell Labs for 14 years, specializing in product development and manufacturing, including interconnection technology, manufacture assembly and reliability, network management, and wireless network. He has been responsible for R\u0026amp;D in robust product design and manufacture and for guiding various manufacturing locations in planning and conducting reliability and stress testing programs. Dr. Chan has taught several training courses in reliability and stress testing and is a regular speaker on these topics. Moreover, he is an adjunct faculty member at the Hong Kong Polytechnic University.\u003cbr\u003e Paul J. Englert is a distinguished member of the technical staff in the Product Realization Department of Lucent Technologies' Wireless Networks Group. He is responsible for wide-scale deployment of mechanical computer-aided design (CAD) and work-in-progress data management solutions. Also, Dr. Englert develops Web-based, multimedia training tools for engineering practices and CAD tools and has lectured in China, Singapore, South Korea, and Taiwan on these subjects. Also, his experience spans a broad spectrum of projects in assembly, manufacturing, stress testing, chemical solvent replacement process development, and statistical modeling.  Electrical Engineering Accelerated Stress Testing Handbook Guide for Achieving Quality Products As we move closer to a genuinely global economy, the pressure to develop highly reliable products on ever-tighter schedules will increase. Part of a designer's \"toolbox\" for achieving product reliability in a compressed time frame should be a set of best practices for utilizing accelerated stress testing (AST). The Accelerated Stress Testing Handbook delineates a core set of AST practices as part of an overall methodology for enhancing hardware product reliability. The techniques presented will teach readers to identify design deficiencies and problems with component quality or manufacturing processes early in the product's life, and then to take corrective action as quickly as possible. A wide array of case studies gleaned from leading practitioners of AST supplement the theory and methodology, which will provide the reader with a more concrete idea of how AST truly enhances quality in a reduced time frame. Important topics covered include:\u003cbr\u003e * Theoretical basis for AST\u003cbr\u003e * General AST best practices\u003cbr\u003e * AST design and manufacturing processes\u003cbr\u003e * AST equipment and techniques\u003cbr\u003e * AST process safety qualification\u003cbr\u003e In this handbook, AST cases studies demonstrate thermal, vibration, electrical, and liquid stress application; failure mode analysis; and corrective action techniques. Individuals who would be interested in this book include: reliability engineers and researchers, mechanical and electrical engineers, those involved with all facets of electronics and telecommunications product design and manufacturing, and people responsible for implementing quality and process improvement programs.","brand":"Wiley-IEEE Press","offers":[{"title":"Default Title","offer_id":47988652277989,"sku":"NP9780780360259","price":245.95,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/1842\/7735\/files\/9780780360259.jpg?v=1761781125","url":"https:\/\/k12savings.com\/products\/accelerated-stress-testing-handbook-isbn-9780780360259","provider":"K12savings","version":"1.0","type":"link"}