{"product_id":"scanning-probe-microscopy-in-industrial-applications-isbn-9781118288238","title":"Scanning Probe Microscopy in Industrial Applications","description":"\u003cp\u003e\u003cb\u003eDescribes new state-of-the-science tools and their contribution to industrial R\u0026amp;D\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eWith contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R\u0026amp;D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others.\u003c\/p\u003e \u003cp\u003e\u003ci\u003eScanning Probe Microscopy in Industrial Applications\u003c\/i\u003e emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments.\u003c\/p\u003e \u003cp\u003eThe second half of the book describes applications of nanomechanical characterization in industry, including:\u003c\/p\u003e \u003cul\u003e \u003cli\u003eNew formulation development for pharmaceuticals\u003c\/li\u003e \u003cli\u003eMeasurement of critical dimensions and thin dielectric films in the semiconductor industry\u003c\/li\u003e \u003cli\u003eEffect of humidity and temperature on biomaterials\u003c\/li\u003e \u003cli\u003eCharacterization of polymer blends to guide product formulation in the chemicals sector\u003c\/li\u003e \u003cli\u003eUnraveling links between food structure and function in the food industry\u003c\/li\u003e \u003c\/ul\u003e \u003cp\u003eContributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R\u0026amp;D problems.\u003c\/p\u003e \u003cp\u003eBy explaining the fundamentals before advancing to applications, \u003ci\u003eScanning Probe Microscopy in Industrial Applications\u003c\/i\u003e offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R\u0026amp;D efforts.\u003c\/p\u003e  \u003cp\u003eContributors List xiii\u003c\/p\u003e \u003cp\u003ePreface xv\u003c\/p\u003e \u003cp\u003eAcknowledgments xix\u003c\/p\u003e \u003cp\u003e\u003cb\u003e1. Overview of Atomic Force Microscopy 1\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eDalia G. Yablon\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e1.1 A Word on Nomenclature 2\u003c\/p\u003e \u003cp\u003e1.2 Atomic Force Microscopy—The Appeal to Industrial R\u0026amp;D 2\u003c\/p\u003e \u003cp\u003e1.3 Mechanical Properties 5\u003c\/p\u003e \u003cp\u003e1.4 Overview of AFM Operation 6\u003c\/p\u003e \u003cp\u003e1.5 Nanomechanical Methods Surveyed in Book 11\u003c\/p\u003e \u003cp\u003e1.6 Industries Represented 13\u003c\/p\u003e \u003cp\u003eAcknowledgments 14\u003c\/p\u003e \u003cp\u003eReferences 14\u003c\/p\u003e \u003cp\u003e\u003cb\u003e2. Understanding the Tip–Sample Contact: An Overview of Contact Mechanics from the Macro- to the Nanoscale 15\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eTevis D. B. Jacobs, C. Mathew Mate, Kevin T. Turner, and Robert W. Carpick\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e2.1 Hertz Equations for Elastic Contact 15\u003c\/p\u003e \u003cp\u003e2.2 Adhesive Contacts 22\u003c\/p\u003e \u003cp\u003e2.3 Further Extensions of Continuum Contact Mechanics Models 29\u003c\/p\u003e \u003cp\u003e2.4 Thin Films 34\u003c\/p\u003e \u003cp\u003e2.5 Tangential Forces 37\u003c\/p\u003e \u003cp\u003e2.6 Application of Continuum Mechanics to Nanoscale Contacts 42\u003c\/p\u003e \u003cp\u003eAcknowledgments 44\u003c\/p\u003e \u003cp\u003eAppendix 2A Surface Energy and Work of Adhesion 44\u003c\/p\u003e \u003cp\u003eReferences 45\u003c\/p\u003e \u003cp\u003e\u003cb\u003e3. Understanding Surface Forces Using Static and Dynamic Approach–Retraction Curves 49\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eSudharsan Balasubramaniam, Daniel Kiracofe, and Arvind Raman\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e3.1 Tip–Sample Interaction Forces 53\u003c\/p\u003e \u003cp\u003e3.2 Static F–Z Curves 58\u003c\/p\u003e \u003cp\u003e3.3 Dynamic Amplitude\/Phase–Distance Curves 69\u003c\/p\u003e \u003cp\u003e3.4 Brief Guide to VEDA Simulations 78\u003c\/p\u003e \u003cp\u003e3.5 Conclusions 90\u003c\/p\u003e \u003cp\u003eGlossary 91\u003c\/p\u003e \u003cp\u003eReferences 93\u003c\/p\u003e \u003cp\u003e\u003cb\u003e4. Phase Imaging 95\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eDalia G. Yablon and Greg Haugstad\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e4.1 Introduction 95\u003c\/p\u003e \u003cp\u003e4.2 Bistability: Attractive and Repulsive Mode 97\u003c\/p\u003e \u003cp\u003e4.3 Complications in Phase Quantification 107\u003c\/p\u003e \u003cp\u003eReferences 113\u003c\/p\u003e \u003cp\u003e\u003cb\u003e5. Dynamic Contact AFM Methods for Nanomechanical Properties 115\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eDonna C. Hurley and Jason P. Killgore\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e5.1 Introduction 115\u003c\/p\u003e \u003cp\u003e5.2 Force Modulation Microscopy (FMM) 121\u003c\/p\u003e \u003cp\u003e5.3 Contact Resonance (CR) Techniques 125\u003c\/p\u003e \u003cp\u003e5.4 Comparison of FMM and CR-FM 136\u003c\/p\u003e \u003cp\u003e5.5 Other Dynamic Contact Approaches 138\u003c\/p\u003e \u003cp\u003e5.6 Summary and Conclusions 140\u003c\/p\u003e \u003cp\u003eAcknowledgments 141\u003c\/p\u003e \u003cp\u003eAppendix 5A Data Analysis Procedure for Contact Resonance Spectroscopy Measurements 141\u003c\/p\u003e \u003cp\u003eReferences 145\u003c\/p\u003e \u003cp\u003e\u003cb\u003e6. Guide to Best Practices for AFM Users 150\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eGreg Haugstad\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e6.1 Force–Distance Measurements—Instrumental Sources of Nonideality 151\u003c\/p\u003e \u003cp\u003e6.2 Force–Distance Measurements—Physical Sources of Nonideality 157\u003c\/p\u003e \u003cp\u003eReferences 161\u003c\/p\u003e \u003cp\u003e\u003cb\u003e7. Nanoindentation Measurements of Mechanical Properties of Very Thin Films and Nanostructured Materials at High Spatial Resolution 162\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eSteve J. Bull\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e7.1 Introduction 162\u003c\/p\u003e \u003cp\u003e7.2 Bulk Materials 163\u003c\/p\u003e \u003cp\u003e7.3 Coatings 176\u003c\/p\u003e \u003cp\u003e7.4 Conclusions 188\u003c\/p\u003e \u003cp\u003eAcknowledgments 188\u003c\/p\u003e \u003cp\u003eReferences 188\u003c\/p\u003e \u003cp\u003e\u003cb\u003e8. Scanning Probe Microscopy for Critical Measurements in the Semiconductor Industry 190\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eJohann Foucher\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e8.1 Introduction 190\u003c\/p\u003e \u003cp\u003e8.2 Critical Dimension in the Semiconductor Industry 191\u003c\/p\u003e \u003cp\u003e8.3 CD Metrology Techniques for Production 192\u003c\/p\u003e \u003cp\u003e8.4 Obtaining Accurate CD in the Semiconductor Industry 194\u003c\/p\u003e \u003cp\u003e8.5 Hybrid Metrology as a Final Solution to Overcome CD-AFM, CD-SEM, and Scatterometry Intrinsic Limitations 203\u003c\/p\u003e \u003cp\u003e8.6 Conclusion 208\u003c\/p\u003e \u003cp\u003eReferences 208\u003c\/p\u003e \u003cp\u003e\u003cb\u003e9. Atomic Force Microscopy of Polymers 210\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eAndy H. Tsou and Dalia G. Yablon\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e9.1 Introduction 210\u003c\/p\u003e \u003cp\u003e9.2 Tapping Phase AFM 213\u003c\/p\u003e \u003cp\u003e9.3 Nanoindentation 217\u003c\/p\u003e \u003cp\u003e9.4 Force Modulation 218\u003c\/p\u003e \u003cp\u003e9.5 Pulsed Force Imaging 219\u003c\/p\u003e \u003cp\u003e9.6 Force–Volume AFM 220\u003c\/p\u003e \u003cp\u003e9.7 HarmoniX and Peak Force QNM Imaging 222\u003c\/p\u003e \u003cp\u003e9.8 Summary 227\u003c\/p\u003e \u003cp\u003eReferences 229\u003c\/p\u003e \u003cp\u003e\u003cb\u003e10. Unraveling Links between Food Structure and Function with Probe Microscopy 232\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eA. Patrick Gunning and Victor J. Morris\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e10.1 Introduction 232\u003c\/p\u003e \u003cp\u003e10.2 Gels and Thickeners: Molecular Networks 236\u003c\/p\u003e \u003cp\u003e10.3 Emulsions and Foams: Protein–Surfactant Competition 238\u003c\/p\u003e \u003cp\u003e10.4 Interfacial Structure and Digestion: Designer Interfaces 241\u003c\/p\u003e \u003cp\u003e10.5 Force Spectroscopy: Model Emulsions 244\u003c\/p\u003e \u003cp\u003e10.6 Force Spectroscopy: Origins of Bioactivity 247\u003c\/p\u003e \u003cp\u003e10.7 Conclusions 248\u003c\/p\u003e \u003cp\u003eReferences 249\u003c\/p\u003e \u003cp\u003e\u003cb\u003e11. Microcantilever Sensors for Petrochemical Applications 251\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eAlan M. Schilowitz\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e11.1 Introduction 251\u003c\/p\u003e \u003cp\u003e11.2 Background 252\u003c\/p\u003e \u003cp\u003e11.3 Applications 257\u003c\/p\u003e \u003cp\u003e11.4 Conclusion 266\u003c\/p\u003e \u003cp\u003eReferences 267\u003c\/p\u003e \u003cp\u003e\u003cb\u003e12. Applications of Scanning Probe Methods in Cosmetic Science 270\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eGustavo S. Luengo and Anthony Galliano\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e12.1 Introduction 270\u003c\/p\u003e \u003cp\u003e12.2 Substrates of Cosmetics 271\u003c\/p\u003e \u003cp\u003e12.3 Mechanical Properties and Modifications by Cosmetic Products 274\u003c\/p\u003e \u003cp\u003e12.4 Scanning Probe Technologies Adapted to Cosmetic Science 275\u003c\/p\u003e \u003cp\u003e12.5 Conclusions 285\u003c\/p\u003e \u003cp\u003eReferences 285\u003c\/p\u003e \u003cp\u003e\u003cb\u003e13. Applications of Scanning Probe Microscopy and Nanomechanical Analysis in Pharmaceutical Development 287\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eMatthew S. Lamm\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e13.1 Introduction 287\u003c\/p\u003e \u003cp\u003e13.2 Applications of SPM Imaging 288\u003c\/p\u003e \u003cp\u003e13.3 SPM as a Screening Tool 291\u003c\/p\u003e \u003cp\u003e13.4 Applications of Nanoindentation 293\u003c\/p\u003e \u003cp\u003e13.5 Conclusion 299\u003c\/p\u003e \u003cp\u003eAcknowledgments 299\u003c\/p\u003e \u003cp\u003eReferences 300\u003c\/p\u003e \u003cp\u003e\u003cb\u003e14. Comparative Nanomechanical Study of Multiharmonic Force Microscopy and Nanoindentation on Low Dielectric Constant Materials 302\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eKatharine Walz, Robin King, Willi Volksen, Geraud Dubois, Jane Frommer, and Kumar Virwani\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e14.1 Introduction 302\u003c\/p\u003e \u003cp\u003e14.2 Experimental 308\u003c\/p\u003e \u003cp\u003e14.3 Results and Discussions 311\u003c\/p\u003e \u003cp\u003e14.4 Conclusions 319\u003c\/p\u003e \u003cp\u003eAcknowledgments 320\u003c\/p\u003e \u003cp\u003eReferences 320\u003c\/p\u003e \u003cp\u003e\u003cb\u003e15. Nanomechanical Characterization of Biomaterial Surfaces: Polymer Coatings That Elute Drugs 323\u003c\/b\u003e\u003cbr\u003e \u003ci\u003eKlaus Wormuth and Greg Haugstad\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e15.1 Introduction 323\u003c\/p\u003e \u003cp\u003e15.2 Materials and Methods 325\u003c\/p\u003e \u003cp\u003e15.3 Dexamethasone in PBMA or PBMA–PLMA Polymer Blends 327\u003c\/p\u003e \u003cp\u003e15.4 Simvastatin in PEO–PBT Copolymers 337\u003c\/p\u003e \u003cp\u003e15.5 Concluding Comments 340\u003c\/p\u003e \u003cp\u003eAcknowledgments 341\u003c\/p\u003e \u003cp\u003eReferences 341\u003c\/p\u003e \u003cp\u003eIndex 342\u003c\/p\u003e  \u003cp\u003e\u003cb\u003eDALIA G. YABLON, PhD,\u003c\/b\u003e developed and led a state-of-the-art scanning probe microscopy facility for more than ten years in Corporate Strategic Research, the flagship R\u0026amp;D center of ExxonMobil Corporation. Under her direction, scanning probe microscopy was used to characterize, conduct failure analysis, and probe structure-property relationships across all sectors of the vast petroleum business including areas of polymers, tribology, corrosion, geochemistry, and metallurgy. She currently leads SurfaceChar, a characterization consulting company.\u003c\/p\u003e","brand":"Wiley","offers":[{"title":"Default Title","offer_id":47989990260965,"sku":"NP9781118288238","price":148.95,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/1842\/7735\/files\/9781118288238.jpg?v=1761786129","url":"https:\/\/k12savings.com\/es\/products\/scanning-probe-microscopy-in-industrial-applications-isbn-9781118288238","provider":"K12savings","version":"1.0","type":"link"}