{"product_id":"runs-and-scans-with-applications-isbn-9780471248927","title":"Runs and Scans with Applications","description":"Expert practical and theoretical coverage of runs and scans\u003cbr\u003e This volume presents both theoretical and applied aspects of runs and scans, and illustrates their important role in reliability analysis through various applications from science and engineering. Runs and Scans with Applications presents new and exciting content in a systematic and cohesive way in a single comprehensive volume, complete with relevant approximations and explanations of some limit theorems.\u003cbr\u003e The authors provide detailed discussions of both classical and current problems, such as:\u003cbr\u003e * Sooner and later waiting time\u003cbr\u003e * Consecutive systems\u003cbr\u003e * Start-up demonstration testing in life-testing experiments\u003cbr\u003e * Learning and memory models\u003cbr\u003e * \"Match\" in genetic codes\u003cbr\u003e Runs and Scans with Applications offers broad coverage of the subject in the context of reliability and life-testing settings and serves as an authoritative reference for students and professionals alike.Dieser Band führt anhand vieler Beispiele aus Naturwissenschaft und Technik in spezielle Kapitel der Zuverlässigkeitsanalyse ein. Theoretische Ausführungen werden anschaulich mit praktischen Anwendungen, meist aus der Industrie, verknüpft, um den Leser zur tiefgründigen Einarbeitung in die Konzepte zu motivieren. Erläutert werden auch relevante Näherungen und Randwertsätze.  List of Tables.\u003cbr\u003e \u003cbr\u003e List of Figures.\u003cbr\u003e \u003cbr\u003e Preface.\u003cbr\u003e \u003cbr\u003e Introduction and Historical Remarks.\u003cbr\u003e \u003cbr\u003e Waiting for the First Run Occurrence.\u003cbr\u003e \u003cbr\u003e Applications.\u003cbr\u003e \u003cbr\u003e Waiting for Multiple Run Occurrences.\u003cbr\u003e \u003cbr\u003e Number of Run Occurrences.\u003cbr\u003e \u003cbr\u003e Sooner\/Later Run Occurrences.\u003cbr\u003e \u003cbr\u003e Multivariate Run-Related Distributions.\u003cbr\u003e \u003cbr\u003e Applications.\u003cbr\u003e \u003cbr\u003e Waiting for the First Scan.\u003cbr\u003e \u003cbr\u003e Waiting for Multiple Scans.\u003cbr\u003e \u003cbr\u003e Number of Scan Occurrences.\u003cbr\u003e \u003cbr\u003e Applications.\u003cbr\u003e \u003cbr\u003e Bibliography.\u003cbr\u003e \u003cbr\u003e Author Index.\u003cbr\u003e \u003cbr\u003e Subject Index.  “…many excellent features…” (\u003ci\u003eStatistical Methods in Medical Research\u003c\/i\u003e, No.13, 2004)  \u003cp\u003e\"...provides excellent coverage of the topic of scans, and runs, including a nice historical account and guide to the literature...\" (\u003ci\u003eTechnometrics\u003c\/i\u003e, Vol. 44, No. 4, November 2002)\u003c\/p\u003e \u003cp\u003e\"...highly recommended…well done and perfectly edited...\" (\u003ci\u003eJournal of the American Statistical Association\u003c\/i\u003e, December 2002)\u003c\/p\u003e \u003cp\u003e\"...a great resource...\" (\u003ci\u003eInternational Journal of General Systems\u003c\/i\u003e, Vol. 32, 2003)\u003c\/p\u003e  N. BALAKRISHNAN, PhD, is Professor of Mathematics and Statistics at McMaster University in Hamilton, Ontario, Canada. He is also the author of A First Course in Order Statistics and four volumes of the Distributions in Statistics series (all from Wiley).\u003cbr\u003e \u003cbr\u003e MARKOS V. KOUTRAS, PhD, is Professor of Statistics at the University of Piraeus in Greece, where he researches applied probability, reliability, and distribution theory.  Expert practical and theoretical coverage of runs and scans\u003cbr\u003e \u003cbr\u003e This volume presents both theoretical and applied aspects of runs and scans, and illustrates their important role in reliability analysis through various applications from science and engineering. Runs and Scans with Applications presents new and exciting content in a systematic and cohesive way in a single comprehensive volume, complete with relevant approximations and explanations of some limit theorems.\u003cbr\u003e \u003cbr\u003e The authors provide detailed discussions of both classical and current problems, such as:\u003cbr\u003e * Sooner and later waiting time\u003cbr\u003e * Consecutive systems\u003cbr\u003e * Start-up demonstration testing in life-testing experiments\u003cbr\u003e * Learning and memory models\u003cbr\u003e * \"Match\" in genetic codes\u003cbr\u003e \u003cbr\u003e Runs and Scans with Applications offers broad coverage of the subject in the context of reliability and life-testing settings and serves as an authoritative reference for students and professionals alike.","brand":"Wiley","offers":[{"title":"Default Title","offer_id":47989976039653,"sku":"NP9780471248927","price":215.95,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/1842\/7735\/files\/9780471248927.jpg?v=1761786094","url":"https:\/\/k12savings.com\/es\/products\/runs-and-scans-with-applications-isbn-9780471248927","provider":"K12savings","version":"1.0","type":"link"}